Real-time nanoparticle particle size monitoring device

Description:

Performance quality of many industrial materials depends on consistent distribution of particle sizes within the material.  The ability to quantify other parameters such as surface roughness, surface area, and particle shape is also desirable.  Current methods provide a static, batched measurement of limited utility.  This new method and device provides real-time measurements directly from the manufacturing line flow.

This device has demonstrated performance on paper additive products with aspect ratios ranging from 2 to 8 and short axis diameters between 100 and 500 nm.  Applications are in quality control.

 

 

Patent Information:
For Information, Contact:
Kris Burton
Technology Commercialization Manager
University of Maine
kris.burton@maine.edu
Inventors:
Micheal Mason
David Neivandt
Keywords:
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